True-color navigation and correlation
Navigate to regions of interest based on true color, surface appearance, or sample markings that are not visible with SEM contrast alone.
WEBINAR | Correlated Microanalytical Workflows for Particle Analysis Using Automated Mineralogy, FIB-SEM and SIMS
Navigate by true color, image correlation, or unseen marks beyond SEM contrast
Tescan ONCam provides intuitive, image-based sample navigation directly within the Tescan Essence™ software environment. It uses a color optical camera mounted to the chamber to deliver a photo-realistic image of the specimen stage at any time. Equipped with four independent LED segments and an advanced minimum intensity stacking algorithm, ONCam eliminates reflections in optical images. Integration with Essence™ software enables quick “click and move” navigation and seamless overlay of SEM images on optical captures with adjustable transparency.
True-color navigation and correlation
Navigate to regions of interest based on true color, surface appearance, or sample markings that are not visible with SEM contrast alone.
Comprehensive imaging and documentation
Combine optical and SEM images into a single macro view for reporting and archival purposes. Correlate detailed SEM data with photo-realistic ONCam images and save them together.
Extended field of view
Overcome field-of-view limitations, especially in Low Vacuum mode by using ONCam’s color imaging to extend coverage up to 165 x 125 mm.
Faster Access to the Region of Interest
ONCam navigation image. Export coordinates to the optional Essence™ Image Snapper module to automate imaging at predefined locations and settings.
AI-powered automated workflow
The AI-driven automated lamella preparation reduces human error, shortens training time, and enables reliable unattended operation. The automation is realized through the TEM AutoPrep™ Pro software module and the OptiLift™ nanomanipulator, forming a fully integrated system that delivers fast lamella preparation while ensuring consistent quality.
Ultimate quality of TEM lamellae
A fully integrated Aura™ Gentle Ion Beam enables precise final polishing and gentle low-keV Ar⁺ cleaning of TEM lamellae directly inside the AMBER 2 FIB-SEM, minimizing amorphous damage and surface Ga+ contamination.
This built-in solution provides direct, real-time control over the polishing process, ensuring the highest sample quality and optimal results in TEM lamellae preparation, even for the most challenging materials.
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10+ MPx RGB optical camera integrated with Tescan Essence™ software
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Four-segment LED lighting with reflection control |
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Image correlation overlay with adjustable transparency |
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Field of view up to 165 x 125 mm |
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Easy probe tip replacement using the removable arm |
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Automatic acquisition during chamber pumping or after load-lock loading is available. Export/Import of the OnCam project |
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10+ MPx RGB optical camera integrated with Tescan Essence™ software
|
|
Four-segment LED lighting with reflection control |
|
Image correlation overlay with adjustable transparency |
|
Field of view up to 165 x 125 mm |
|
Easy probe tip replacement using the removable arm |
|
Automatic acquisition during chamber pumping or after load-lock loading is available. Export/Import of the OnCam project |
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