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On-demand WEBINAR | Correlated Microanalytical Workflows for Particle Analysis Using Automated Mineralogy, FIB-SEM and SIMS 

Micrometer-sized particles contain critical information for geoscience, environmental and nuclear research, but advanced particle analysis often requires more than a single analytical technique.

In this on-demand webinar, Professor William Rickard presents correlated microanalytical workflows combining Automated Mineralogy, TIMA, FIB-SEM and SIMS for comprehensive particle characterization and isotopic analysis.

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In this webinar, Professor William Rickard from the John de Laeter Centre at Curtin University presents correlated microanalytical workflows that combine Automated Mineralogy, FIB-SEM, ToF-SIMS and LG-SIMS for comprehensive particle characterization. The session demonstrates how automated large-area particle search can be linked with targeted, high-resolution and isotopic analysis across multiple instruments. 

A key focus of the webinar is one of the fundamental challenges in particle analysis: before a particle can be characterized, it first needs to be reliably found, localized and relocated throughout the workflow. Using Automated Mineralogy as the entry point, researchers can rapidly screen large sample areas, identify particles of interest and transfer their coordinates for detailed  analysis. 

The webinar explores practical workflows developed at Curtin University for geoscience and nuclear particle analysis applications, including methods for correlating particle data between TIMA, FIB-SEM and SIMS platforms. Professor Rickard also discusses how morphology, chemistry, phase and isotopic information can be combined to create a more complete analytical picture while preserving analytical context between instruments.

Why This Matters

Modern microanalytical techniques provide exceptional spatial and chemical resolution, but their analytical volume and throughput are often limited. Correlative workflows help bridge this gap by connecting large-area automated search with targeted microanalysis and isotopic characterization.

By integrating Automated Mineralogy with FIB-SEM and SIMS, researchers can:

  • Rapidly locate rare particles within large datasets

  • Precisely relocate the same particle across multiple instruments

  • Combine morphology, mineralogy, chemistry, and isotopic information 

  • Improve analytical efficiency and confidence in data interpretation

What You Will Learn

  • How Automated Mineralogy supports high-throughput particle search and screening

  • How correlated workflows connect TIMA, FIB-SEM, and SIMS techniques

  • How particle relocation traceability is achieved across multiple analytical platforms

  • How morphology, phase, chemistry and isotopic data can be combined

  • How these workflows support advanced geoscience and nuclear particle analysis applications

  • How targeted microanalysis improves characterization of rare or complex particles

Register to access the on-demand webinar and explore how Tescan TIMA Automated Mineralogy, FIB-SEM and SIMS workflows improve particle analysis, particle relocation and multi-instrument microanalysis across geoscience applications.

Speakers

William Rickard-1
Professor William Rickard

Director of the John de Laeter Centre, Curtin University

Prof. Rickard is a Materials Scientist and the Director of the John de Laeter Centre (JdLC) at Curtin University.

He is an experienced researcher (>150 peer-reviewed publications) with interests in micro- to nano-scale chemistry and the structure of minerals and materials.

He has almost 20 years of experience working in university analytical facilities and specializes in imaging mass spectrometry (ToF-SIMS), focused ion beam – scanning electron microscopy (FIB-SEM), and associated microanalytical techniques (EDS, EBSD, SIMS).

He has been at the forefront of the development of FIB-SIMS applications as well as techniques for correlative analyses involving electron microscopy, mass spectrometry, and atom probe tomography. 

Eligiusz Przemyslaw Gugala, Tescan
Eligiusz Przemyslaw Gugala

Product Manager, Tescan

 

Eligiusz transitioned from a career in mineralogy into product management, bringing strong hands‑on experience with automated mineralogy in real industrial environments.

Through his work optimizing plant recovery, he gained first‑hand insight into the challenges of high‑volume materials characterization.

At Tescan, Eligiusz now applies this operational knowledge to shaping the R&D roadmap for TIMA and SEM solutions.

His focus is on aligning advanced hardware technologies, including detectors and optics, with intelligent software automation to deliver reliable, high‑performance instruments for applications in Mining, Batteries, and Materials Science.

Unlocked content
Correlated Microanalytical Workflows for Particle Analysis Using Automated Mineralogy, FIB-SEM and SIMS

Watch the On-Demand Webinar Now

Correlated Workflows for Advanced Microanalysis 

Learn how TIMA, FIB-SEM, and SIMS can be combined to improve particle relocation, analytical traceability, and characterization of rare or complex particles. 

 

Register for the webinar