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On-demand WEBINAR | Improved TEM Specimen Quality and Lab Throughput with the new AMBER 2 Ga⁺ FIB-SEM

High-quality TEM specimen preparation remains a challenge in advanced materials characterization. In this on-demand webinar, Martin Sláma shows how the new Orage 2^TM FIB column on AMBER 2 helps make FIB-SEM workflows more robust, reproducible, and efficient across different materials and users. Watch the recording to learn how improved beam performance, automation, and integrated gentle ion beam polishing support more consistent TEM specimen preparation, lower damage, and higher lab throughput.

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Preparing high-quality TEM specimens is not only about reaching electron transparency. The real challenge is to achieve the required thickness, good lamella uniformity, and low induced damage in a way that is reliable across different materials and different users.

In this webinar, Martin Slama explains how the new Orage 2^TM Ga⁺ FIB-SEM column improves focused ion beam scanning electron microscopy workflows for materials science. He shows how improved beam current density, sharper beam profiles, and better low kV performance help make TEM specimen preparation easier even for challenging materials , support cleaner polishing, and make final thinning more precise.

The webinar also covers the practical value of automation in FIB-SEM specimen preparation, including reduced user intervention, stronger workflow consistency, and the ability to run automated TEM preparation overnight. In addition, it introduces the integrated Aura™ Gentle Ion Beam workflow for final low-energy cleaning inside the same platform, helping reduce transfer-related risks, contamination, and specimen damage and better control over the polishing process.

Why watch

This webinar is relevant for materials scientists, electron microscopy specialists, and researchers working with TEM, STEM, S/TEM, and FIB-SEM workflows who want to improve specimen quality while using instrument time more efficiently.

By watching the recording, you will learn:

How the Orage 2™ Ga⁺ FIB-SEM column improves beam performance to support TEM specimen preparation
How improved low kV performance supports more precise final polishing and easier specimen navigation
How automation reduces user intervention and supports more consistent TEM specimen preparation
How overnight automated workflows can increase laboratory throughput
How the integrated Aura™ Gentle Ion Beam helps minimize induced damage and improve final specimen quality
How integrated Ar⁺ ion beam polishing on the FIB-SEM supports better process control
How improved FIB-SEM performance benefits not only TEM preparation, but also cross-sectioning and 3D characterization workflows

What makes this session worth your time

More reliable TEM specimen preparation
The webinar explains how a more universal workflow can help deliver high-quality TEM specimens across different sample types, including hard and complex materials, without relying heavily on user experience or special preparation tricks.
Better beam performance with Orage 2™
You will see how improved beam shape, reduced beam tails, and better collimation support cleaner polishing, lower taper, and more controlled milling.
Low kV polishing and specimen quality
The session shows why final low-energy polishing is critical for reducing amorphous damage and preserving the material as close as possible to its pristine state.
Integrated gentle ion beam cleaning
The webinar demonstrates how integrated low-energy Argon polishing down to 200 eV supports final specimen cleaning inside one platform, without moving fragile lamellae between separate systems.
Automation and throughput
Martin also shows how automated TEM specimen preparation can reduce user intervention by more than 75%, support overnight operation, and significantly improve lab throughput.

Speakers

Martin Slama
Product Marketing Manager

Specialist in advanced FIB-SEM workflows for materials science, with extensive experience in 3D characterization and high-precision TEM sample preparation. His expertise spans Ga FIB-SEMs technology, artifact-free milling, and automation strategies that enhance throughput without compromising quality.

He regularly shares insights through international conferences and workshops, focusing on bridging speed, precision, and usability in electron microscopy.

Unlocked content

Improved TEM Specimen Quality and Lab Throughput with the new AMBER 2 Ga⁺ FIB-SEM

WEBINAR RECORDING

Improved TEM Specimen Quality and Lab Throughput with the new AMBER 2 Ga⁺ FIB-SEM

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