In materials science multi-user facilities, TEM systems enable highly efficient nanoscale analysis, yet overall productivity is often limited by a less visible bottleneck: sample preparation. Conventional FIB-SEM workflows for TEM lamella preparation still rely heavily on operator availability and expertise, introducing user-to-user variability that can affect sample quality. As a result, even advanced TEM instruments may remain underutilized when suitable specimens are not available in time, delaying time-to-data.
Discover how automated, unattended TEM sample preparation using Orage™ 2 Ga⁺ FIB technology overcomes these limitations while maintaining consistent lamella quality, helping laboratories improve efficiency and maximize valuable TEM time.
