Senior expert in scanning electron microscopy (SeM)
Tescan
With extensive experience in electron beam imaging and SEM applications, Tomas works closely with researchers and industry professionals to help them achieve the highest quality analytical and imaging results.
Tomas has been deeply involved in the development and positioning of Tescan's new-generation CLARA™ field-free ultra-high-resolution SEM, bringing valuable insight into its technology, capabilities, and real-world applications.
In this webinar, he will share his expertise and discuss how the latest Tescan CLARA™ platform helps users gain deeper insights from their samples with greater ease and efficiency.
