Direct overlay in live FIB-SEM view
Align and fabricate structures precisely, without switching interfaces.
WEBINAR | Correlated Microanalytical Workflows for Particle Analysis Using Automated Mineralogy, FIB-SEM and SIMS
Precision Patterning for Advanced Nanofabrication
Expandable software module for high-precision nanopatterning and nanofabrication applications
Designed for researchers shaping the nanoscale
Essence™ DrawBeam is an integrated modular patterning engine for Tescan FIB-SEM systems. It enables standard sample FIB processing workflows, such as cross-sectioning, as well as the development and application of advanced nanofabrication workflows, 3D structure creation. With a combination of the highest range of milling objects and layer based automation, it simplifies complex tasks such as preparation of special samples for mechanical testing or dedicated nano prototyped structures.
Direct overlay in live FIB-SEM view
Align and fabricate structures precisely, without switching interfaces.
Purpose-built object library
Prototype micro and nano-devices using predefined shapes: lines, circles, polygons, and more.
CAD-style multistep patterning
Import bitmap, GDSII, or DXF files and adjust parameters per layer and object.
Batch processing for multifield exposure
Automate repetitive tasks with DrawBeam Automate’s scalable workflow tools.
Material-driven patterning
Reference and edit a built-in database with exposure and spacing settings for diverse substrates.
Custom recipe development
Save and reuse complex FIB-SEM preparation protocols tailored to your research.
Drift correction for long exposures
Maintain alignment and avoid artefacts during extended fabrication runs.
Parallel or serial patterning
Prevent object overlap and ensure clean, repeatable nanostructures.
3D nanopatterning with FEBID/FIBID
Create resonators and other complex geometries using a wide range of gas injection precursors.
Accelerated etching
Use proprietary precursors to boost milling speed across substrates.
Controlled rocking for surface quality
Improve cross-section perpendicularity and finish with DrawBeam Automate’s rocking stage support.*
*Requires Tescan Rocking Stage
AI-powered automated workflow
The AI-driven automated lamella preparation reduces human error, shortens training time, and enables reliable unattended operation. The automation is realized through the TEM AutoPrep™ Pro software module and the OptiLift™ nanomanipulator, forming a fully integrated system that delivers fast lamella preparation while ensuring consistent quality.
Ultimate quality of TEM lamellae
A fully integrated Aura™ Gentle Ion Beam enables precise final polishing and gentle low-keV Ar⁺ cleaning of TEM lamellae directly inside the AMBER 2 FIB-SEM, minimizing amorphous damage and surface Ga+ contamination.
This built-in solution provides direct, real-time control over the polishing process, ensuring the highest sample quality and optimal results in TEM lamellae preparation, even for the most challenging materials.
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Compatible with all Tescan FIB-SEM systems
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X, Y, and Z axis manipulation |
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Reliable in-situ TEM lamella lift-out |
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Smooth, low-vibration performance |
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Easy probe tip replacement using the removable arm |
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Compatible with all Tescan FIB-SEM systems
|
|
X, Y, and Z axis manipulation |
|
Reliable in-situ TEM lamella lift-out |
|
Smooth, low-vibration performance |
|
Easy probe tip replacement using the removable arm |
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