New CLARA™ SEM for Nanoscale Materials Characterization
Tescan launches the new CLARA™, an ultra-high-resolution SEM designed for nanoscale materials characterization and advanced imaging.
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Tescan launches the new CLARA™, an ultra-high-resolution SEM designed for nanoscale materials characterization and advanced imaging.
Tescan joins the Shimadzu Group, expanding innovation, global reach, and integrated solutions while maintaining its customer-focused approach.
Tescan offers on‑site demos in a new scanning electron microscopy lab in Korea, supporting the semiconductor industry, research institutions and universities with FIB‑SEM expertise.
Carlyle and other shareholders have entered into an agreement with Shimadzu Corporation that may result in a change in Tescan’s shareholding structure, subject to approvals.
Learn what FIB-SEM is, how it works, and why it is essential for nanoscale imaging, sample preparation, and advanced materials characterization.
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