Join the UK & I FIB ToF-SIMS Network for a one-day, in-person workshop at Cranfield University on 27 April 2026, co-organised by Cranfield University and Tescan in UK. The day combines short presentations covering technology, theory, and practical applications of FIB-based ToF-SIMS, followed by an afternoon of hands-on sessions using a live FIB ToF-SIMS system. You’ll also get guided support on data processing software and practical help solving real data challenges.
Dr. Tomáš Šamořil is Product Marketing Manager for Materials Science at Tescan, specialising in electron microscopy and advanced materials analysis. His work focuses on analytical FIB-SEM and integrated ToF-SIMS workflows, with particular experience in battery research and complex material characterisation.
Jeremie Silvent leads product sales activities across NSR, Nanospace, ion beam (IB), and UHV platforms at Tescan. He supports advanced FIB-SEM and integrated analytical solutions, working closely with research and industry partners to align instrument capabilities with demanding application needs.
