We successfully organized a hands-on workshop ToF-SIMS UK workshop together with Cranfield University focused on showcasing the capabilities and practical applications of our instruments.
The workshop combined technical presentations with live demonstrations, highlighting how FIB-SEM and integrated ToF-SIMS-based workflows can be applied in materials science, semiconductor research, and advanced characterization. Experts from academia and industry shared use cases covering chemical imaging, depth profiling, and nanoscale analysis.
The event provided a focused environment for knowledge exchange, technical discussion, and networking, enabling participants to explore real-world applications and workflow optimization strategies.
We thank all speakers, contributors, and attendees for their active participation and valuable insights.
Interested in FIB-SEM ToF-SIMS, surface analysis, or integrated microscopy workflows?
Learn more about how these technologies support materials characterization, chemical analysis, and nanoscale imaging, or get in touch with the Tescan team to discuss your specific application.
Senior Technical Officer at Cranfield University, managing the Electron Microscopy Suite within the Cranfield Centre for Materials. Her work focuses on FIB ToF-SIMS, FIB-SEM, and SEM across applications ranging from aerospace to planetary science.
Electron Microscopy Specialist at the UK National Nuclear Laboratory (UKNNL), specialising in advanced characterisation of nuclear materials. She leads PFIB ToF-SIMS capability, focusing on irradiated materials.
Emily Curtis is a Graduate Materials Scientist at the UK Atomic Energy Authority, focusing on ceramic coatings for tritium permeation barriers and lithium corrosion resistance. She specialises in coating characterisation, including thermal and irradiation stability and hydrogen isotope permeation. She holds a BA and MSci in Natural Sciences (Materials Science) from the University of Cambridge.
Tomáš Šamořil is Product Marketing Manager for Materials Science at Tescan, specialising in electron microscopy and advanced materials analysis. His work focuses on analytical FIB-SEM and integrated ToF-SIMS workflows, with particular experience in battery research and complex material characterisation.
Jeremie Silvent leads product sales activities across NSR, Nanospace, ion beam (IB), and UHV platforms at Tescan. He supports advanced FIB-SEM and integrated analytical solutions, working closely with research and industry partners to align instrument capabilities with demanding application needs.
