WEBINAR | Up to 40% Faster Automated TEM Lamella Preparation with new Ga⁺ FIB Column

REGISTER NOW
Back to the webinars

ON-DEMAND WEBINAR | High-Throughput, Ultra-High-Resolution SEM for Multi-User Environments 

ON DEMAND WEBINAR Mira XR SEM
Watch the Recording
Play Now

Discover the Power of Speed and Precision in SEM Imaging

Are you working in a research or industrial environment where every minute counts? 

In this webinar, Tescan experts introduce Tescan MIRA XR – a high-performance scanning electron microscope designed for rapid, precise materials analysis and very good imaging quality in multi-user labs. 

Watch the recording to learn how MIRA XR combines ultra-high-resolution performance with intuitive operation and automated routines, allowing both expert and occasional users to achieve outstanding results with less setup time and higher throughput.

What You’ll Learn

This session, hosted by Peter Klimek, Product Marketing Director, and Tomáš Boruvka, Product Marketing Manager for SEM Solutions, provides a deep look into the challenges and solutions of modern SEM workflows:

1. The Need for Speed and Resolution

  • How ultra-high-resolution imaging at low accelerating voltages reveals details that conventional SEMs miss.
  • Why beam-sensitive or non-conductive samples no longer require metal coating.
  • How the new BrightBeam™ column and In-Flight Beam Tracing™ technology deliver precision faster than ever before.

2. Smarter Workflows for Every User

  • Experience Tescan’s Wide Field Navigation, which keeps the sample always in focus while allowing intuitive movement and zoom.
  • Discover how In-Flight automation optimizes image contrast, brightness, and focus automatically, reducing time-to-data by up to 40%.
  • Learn how automation tools like Visual Coder and SEM Expert PI make repetitive analyses faster and accessible even to non-programmers.

3. From Imaging to Chemical Analysis

  • See how Dual Essence™ EDS enables elemental mapping directly within the same interface, no switching between systems.
  • Understand how dual detectors double signal collection and processing for faster, higher-quality data acquisition.

4. Reliable Performance on Challenging Samples

  • Explore how MultiVac Mode maintains sharp, high-contrast imaging even for charging or outgassing samples.
  • Learn how water vapor and topographic detection improve low-vacuum performance without surface coating.

5. Real Applications, Real Results

Through real-world case studies, the webinar demonstrates how MIRA XR supports:

  • Nanomaterials characterization – imaging down to a few nanometers without sample coating.
  • Metals and fracture analysis – linking microstructure to mechanical performance.
  • Pharmaceutical R&D – automated high-throughput imaging of particle morphology with up to 80% time savings.

Fill out the form below to get instant access to the on-demand webinar.

Meet the speakers

Petr Klimek 1
Petr Klimek

Petr is expert in advanced electron microscopy and materials characterization, specializing in SEM and FIB-SEM technologies for nanoscale analysis.

 

With nearly a decade of experience bridging academia and industry, he has contributed to innovations in ultra-high-resolution imaging, cryogenic workflows, and automated specimen preparation for demanding applications such as atom probe tomography and battery research.

 

Petr’s background includes Fulbright-supported research and extensive work on integrating multimodal analytical techniques to solve real-world challenges in materials science. 

 

Tomas Boruvka
Tomas Boruvka

Tomas brings deep expertise in scanning electron microscopy (SEM) and workflow optimization for materials analysis. With a strong background in materials chemistry and years of experience in SEM applications and R&D, he focuses on making complex imaging processes intuitive and accessible for users.


Tomas has worked extensively on developing user-friendly workflows and automation strategies that enhance efficiency in routine and advanced microscopy tasks.


His passion lies in bridging technology and usability, helping laboratories achieve reliable, high-quality results with minimal complexity.

Unlocked content

 

 

WEBINAR RECORDING

High-Throughput, Ultra-High-Resolution SEM for Multi-User Environments

Fill out the form

to get access to THE WEBINAR RECORDING

Get the most out of Tescan

This is more than information; it's an advantage. We've compiled our technical whitepapers, detailed product flyers, and on-demand webinars to provide you with the knowledge that makes a real difference. Sign up now to access the insights you need to make an impact.