ON-DEMAND WEBINAR | High-Throughput, Ultra-High-Resolution SEM for Multi-User Environments 

See more, work faster, and remove the bottlenecks that slow your lab down

If you manage a busy research facility or support demanding industrial workflows, you already know the pressure: users with different skill levels, a growing volume of samples, and the constant need for high-quality data delivered fast. This on-demand webinar shows how you can break through these limits.

In this session, Tescan experts reveal how the MIRA XR helps multi-user labs achieve both speed and ultra-high resolution without sacrificing consistency. You will see how smarter imaging workflows, automation, and advanced beam technology directly address the real problems researchers face every day. This is not just an introduction to an instrument. It is a look at how to remove the inefficiencies that hold back productivity.

Why you should watch

You will learn how to:

• Cut time-to-data significantly by reducing manual setup and allowing any user to obtain reliable results quickly.

• Capture details conventional SEMs miss, especially on beam-sensitive or non-conductive samples, without coating.

• Handle complex, diverse workloads through intuitive navigation and automation that keeps your lab running smoothly even with multiple operators.

• Integrate chemical analysis seamlessly so your users spend more time analyzing and less time switching tools.

• Work confidently with challenging samples, from charging materials to outgassing specimens, while maintaining sharp, high-contrast imaging.

By the end of the webinar, you will clearly see how the right SEM architecture transforms both throughput and data quality, even in high-demand environments.

What you will learn inside the webinar

1. The Need for Speed and Resolution

• Why low‑kV, ultra‑high‑resolution imaging is essential for today’s materials and why traditional systems struggle.

• How beam-sensitive and non-conductive samples can be imaged without coating.

• How the BrightBeam column and In‑Flight Beam Tracing provide both resolution and speed.

2. Smarter Workflows for Every User

• Wide Field Navigation keeps the sample in focus so users never lose context while navigating.

• In‑Flight automation adjusts contrast, brightness, and focus automatically, helping reduce time-to-data by up to 40 percent.

• Visual Coder and SEM Expert PI simplify repetitive measurements and make automation usable even for non-programmers.

3. From Imaging to Chemical Analysis

• Dual Essence EDS embeds elemental analysis directly in the SEM interface.

• Dual detectors double signal collection for faster, higher-quality maps.

4. Reliable Performance on Challenging Samples

• MultiVac Mode keeps images sharp even on charging or outgassing materials.

• Water vapor and topographic detection enhance low-vacuum performance without coating.

5. Real Applications, Real Results

You will see how MIRA XR accelerates real work in areas such as:

• Nanomaterials imaging at the few-nanometer scale without coating.

• Metals and fracture analysis where structure and mechanical behavior must be linked.

• Pharmaceutical R&D, where automated particle morphology analysis can save up to 80 percent of imaging time.

  
  

Get instant access

Fill out the form to watch the webinar now and see how your lab can gain speed, clarity, and confidence in every session. This is essential viewing if you want to streamline your workflows, support more users effectively, and get more done with the SEM you rely on.