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WEBINAR | Tescan EXLO in Action: Fast, Reliable and Scalable TEM Specimen Preparation

ON DEMAND WEBINAR

Remove bottlenecks in TEM workflows by taking lift-out outside the FIB-SEM and into a dedicated EXLO station

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Webinar Summary 

In this on-demand session, Dr. Lucille A. Giannuzzi presents an in-depth look at Tescan EXLO™, a dedicated solution for ex-situ lift-out in TEM sample preparation. 

Tescan EXLO moves the lift-out step outside the FIB-SEM, enabling parallel milling and manipulation, a major advancement for labs handling high sample volumes. Whether working with semiconductors, materials science specimens, or cryo and beam-sensitive samples, Tescan EXLO delivers a faster, more scalable workflow that reduces bottlenecks and lowers cost per lamella. 

What You'll Learn: 

  • What ex-situ lift-out is and how it compares to in-situ workflows 

  • How Tescan EXLO reduces FIB usage time while increasing throughput 

  • Live examples of lamella manipulation in under 30 seconds 

  • Use cases including MEMS, plan-view prep, Cryo-TEM, and surface analysis 

  • Overview of Tescan EXLO configurations (standard and cryo-ready) and compatible accessories 

Watch now and explore how Tescan EXLO can elevate your TEM sample preparation. 

Meet the speaker

Lucille Giannuzzi
Dr. Lucille A. Giannuzzi, FAVS, FMSA, FMAS

Dr. Giannuzzi is an internationally recognised expert in focused ion beam (FIB) technology and electron microscopy. She invented the EXpressLO (EXLO) system, revolutionizing ex situ lift-out and accelerating TEM specimen preparation.

Former President of EXpressLO LLC and Fellow of AVS, MSA, and MAS, Dr. Giannuzzi has authored over 100 peer-reviewed papers and continues to shape the field through her innovations, teaching, and leadership.

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WEBINAR RECORDING

EXLO in Action: Fast, Reliable and Scalable TEM Specimen Preparation

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