16th ASEM Workshop on Advanced Electron Microscopy     

Tescan at ASEM 2026

Visit Tescan at Table no. 8 to explore application-driven solutions in focused ion beam scanning electron microscopy (FIB-SEM) and advanced ion beam control. Our team will be available to discuss system configurations, throughput optimisation, and integrated analytical approaches tailored to demanding research environments.

If you are working with complex materials, nanostructures, or high-resolution cross-sectioning, this is an opportunity to explore how FIB-SEM solutions can support both resolution and productivity.

Featured Presentation 

Balancing Resolution and Throughput Through Ion Beam Profile Control

This presentation will examine how precise ion beam profile control directly influences milling quality, imaging performance, and analytical efficiency. By optimising beam characteristics, users can achieve the right balance between high resolution and throughput in advanced microscopy workflows.

Who should attend

• Electron microscopy and FIB-SEM users

• Researchers in advanced materials science and nanotechnology

• Facility managers seeking improved throughput in microscopy labs

• Industry professionals evaluating high-resolution and ion beam-based analysis

Register using the form below to receive confirmation and updates about Tescan’s participation at ASEM 2026, including presentation details and opportunities to meet our team during the workshop.