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Proven to Lead: Advancing TEM Sample Preparation with Tescan AMBER X 2 Plasma FIB-SEM 

webinar MATERIALS SCIENCE

University of Sydney and Tescan demonstrate how plasma FIB-SEM delivers both high-volume 3D characterization and precise TEM specimen preparation in a single universal system.

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Webinar description

Modern materials research demands both high-throughput characterization and damage-minimized TEM sample preparation with high reproducibility. The Tescan AMBER X 2 with Mistral™ plasma FIB technology addresses both requirements in one system.

This webinar demonstrates how plasma FIB-SEM now delivers artifact-free TEM lamellae preparation alongside large-scale volume analysis. You'll see real applications and workflows that showcase this dual capability.

Webinar highlist

  • Optimized plasma FIB profiles for artifact-free TEM specimen preparation
  • Real-world case studies from University of Sydney workflows
  • AMBER X 2 performance in precision and versatility applications

Meet the speakers

Felix Theska

Senior Technical Officer at Sydney Microscopy & Microanalysis, University of Sydney, supports researchers in specimen preparation for atom probe tomography and transmission electron microscopy using Ga+, Xe+, and Ar+ FIB-SEM systems. 

Martin Sláma

Product Marketing Manager for FIB-SEM 3D characterization and TEM lamella preparation at Tescan, brings eight years of experience with plasma FIB and Ga+ FIB-SEM solutions for materials characterization.

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AMBER X 2 TEM Sample Preparation _ TESCAN & University of Sydney Webinar

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