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WEBINAR |  “4D-STEM in SEM” – an event-based approach to accessible nano-scale materials characterization

What if the power of 4D-STEM could be brought into a standard scanning electron microscope?

In this webinar with Dr. Ben Britton from University of British Columbia, we will show how a fully integrated TimePix3-based detector system with ultrafast beam blanking enables the collection of information-rich diffraction data at low electron dose, bringing advanced nanoscale analysis into a more accessible and practical SEM (scanning electron microscopy) workflow. 

Jun 24, 2026 Morning and afternoon sessions – select in the form
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What this webinar is about  

Pixelated direct electron detectors in (scanning) transmission electron microscopes have transformed our ability to collect 4D-STEM data - where a full two-dimensional diffraction pattern is recorded at every point across a two-dimensional scan.

But what if the same concept could be brought to the far more accessible scanning electron microscope? 

In this webinar, we explore how a standard SEM can be dramatically upgraded by integrating a TimePix3 direct electron detector with an ultrafast beam blanker.

Tescan has realized this vision through a fully integrated, easy-to-use hardware solution: a retractable STEM detector compatible with AMBER™, CLARA™, and MIRA™ platforms.

The system is engineered for ultralow-dose imaging, leveraging event-based detection with ultra-high dynamic range - eliminating saturation even at the direct beam, and capturing meaningful signal out to high scattering angles (±150 mrad). 

Beyond the hardware, a streamlined software workflow enables real-time data collection, online analysis, and export via annotated HDF5 files compatible with leading open-source 4D-STEM packages including LibreTEM, HyperSpy, and py4DSTEM.

To showcase the system's capabilities, in collaboration with Tescan, we present case studies spanning semiconductor materials, nanoparticles, and metallic polycrystals. 

 

Who should attend 

  • Researchers in materials science 

  • Electron microscopy specialists working with TEM, S/TEM, and FIB-SEM 

  • Experts in advanced materials characterization 

  • Laboratory professionals aiming to optimize TEM specimen preparation workflows 

Speakers

Ben Britton
Dr. Ben Britton

Professor of Materials Engineering, University of British Columbia

Dr. Ben Britton is a Professor of Materials Engineering at the University of British Columbia and a Tier 1 Canada Research Chair in Multiscale Correlative Electron Microscopy. With over 16 years of experience in electron diffraction and more than 100 peer-reviewed publications, his work spans both technique development and real-world materials applications.  

He leads The Electron Microscopy Laboratory at UBC - home to over $20m in analytical instrumentation - and he is widely recognized in the microscopy community for his accessible YouTube tutorials, which have helped thousands of researchers at all career stages master advanced electron microscopy techniques. 

Martin Slama
Martin Slama

Product Marketing Manager, Tescan

Martin Slama is specialist in advanced FIB-SEM workflows for materials science, with extensive experience in 3D characterization and high-precision TEM sample preparation. His expertise spans Ga FIB-SEMs technology, artifact-free milling, and automation strategies that enhance throughput without compromising quality. 

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Choose the session that best fits your time zone

Join Dr. Ben Britton and explore how 4D-STEM can be brought into a standard scanning electron microscope using a fully integrated TimePix3-based detector system with ultrafast beam blanking, enabling low-dose, information-rich diffraction analysis in an accessible SEM workflow. 

 

Register for the webinar