Correlative nanoscale analysis uncovers lithium distribution and chemical pathways that drive cathode performance loss.
Lithium-ion battery degradation often starts at the nanoscale, within electrode structures where traditional imaging falls short. This application note showcases how the integration of Tescan AMBER X 2 FIB-SEM and ToF-SIMS enables precise 3D structural and chemical mapping in a cycled electrode.
By combining structural and chemical insights in a single workflow, researchers gain unprecedented visibility into battery degradation mechanisms, paving the way for longer-lasting, safer batteries.
A multi-functional Ga FIB-SEM workstation offering high-precision milling, ultra-high-resolution imaging, and advanced automation for materials research and TEM sample prep.
Prepare deformation-free, large-area surfaces for reliable EBSD analysis, even in complex, multi-phase materials.
Accelerate your time-to-data with optimized plasma FIB milling, demonstrated on silicon carbide cross-sectioning.
Combined 3D imaging techniques reveal multiscale porosity patterns and their structural impact in HA-ZrO₂ fiber-reinforced ceramics.
Use Tescan TENSOR with integrated beam precession to perform analytical STEM measurements either with existing automated workflows or develop new workflows with own advanced methods.
Targeted oxygen injection enhances surface contrast and reduces curtaining during high-resolution cross-sectioning of carbon materials.
