TESCAN TENSOR
A fully integrated analytical STEM system optimized for high-resolution crystallographic and structural analysis.
- Precession-assisted diffraction imaging for accurate orientation mapping
- Automated optical alignments and fast, hybrid-pixel, direct detector for high yield, high-quality data
- On-the-fly processing of diffraction data for interactive 4D-STEM analysis with meaningful results
- Ideal for structural studies of deformation and grain boundary behavior over large regions of interest.


