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WiSe-Cryst 2026 - Winter School on Electron Crystallography

Tescan is proud to support WiSe-Cryst 2026 – Winter School on Electron Crystallography, taking place March 2–6, 2026 in Jülich, Germany. Organized by Forschungszentrum Jülich and ER-C, this educational school is dedicated to training the next generation of scientists in electron crystallography techniques and applications.

The event focuses on advancing structural science through cutting-edge electron diffraction methods, practical training, and international collaboration among researchers and students.

02 - 06 March 2026

Book your meeting

About WiSe-Cryst 2026

The Winter School on Electron Crystallography provides in-depth education on modern crystallographic approaches using electron microscopy. The program equips researchers and students with the knowledge and practical skills required to fully harness the capabilities of electron diffraction and drive future advancements in structural characterization.

Key themes include:

Electron crystallography fundamentals
Precession-assisted electron diffraction
4D-STEM data acquisition and analysis
Tomographic electron diffraction techniques
Crystal parameter determination and domain analysis

Tescan at WiSe-Cryst 2026

At WiSe-Cryst 2026 - Winter School on Electron Crystallography, Tescan participates as a sponsor and technical contributor, supporting advanced education in electron diffraction and structural analysis.

Electron crystallography continues to evolve rapidly, driven by innovations in 4D-STEM, precession-assisted electron diffraction, and automated diffraction tomography. Tescan contributes to this progress through its Tescan TENSOR analytical STEM platform, designed specifically for high-precision electron diffraction workflows.

Tescan TENSOR for Advanced Electron Crystallography

At the school, Tescan will highlight:

Tescan TENSOR - Advances in precession-assisted electron diffraction technology
Tescan TENSOR is a multimodal analytical STEM optimized for:

Precession-assisted electron diffraction tomography (PEDT)
Automated 4D-STEM mapping
Fast beam precession for improved diffraction quality
Precise crystal tracking during data acquisition
Automated 3D electron diffraction workflows

These capabilities enable accurate determination of crystal parameters, identification of multiple crystal domains, and high-quality structural analysis across complex materials systems.

By combining automated 4D-STEM acquisition with integrated precession electron diffraction, Tescan TENSOR supports reproducible, high-resolution crystallographic analysis, making it a powerful solution for researchers working in materials science, nanotechnology, and structural chemistry.

Who Should Attend

Researchers in structural science
PhD students and postdoctoral scientists
Electron microscopy specialists
Crystallography and materials science professionals

Book a meeting withour specialists to see how 4D-STEM and precession-assisted electron diffraction can enhance your crystallographic analysis.

Our specialist

Brendan Clarke
Application Specialist - TEM

He is a Senior Application Specialist – TEM at Tescan within the Applications & Demo Labs team, specializing in materials science and optoelectronic applications in both scanning and transmission electron microscopy. With a background as an optoelectronics researcher and electronic design engineer, he has published high-profile work in photonic and electron beam science and brings strong academic and professional leadership experience. His expertise spans analog and digital design, embedded systems, microcontroller-driven data acquisition and analysis, as well as advanced electron microscopy, nano-fabrication, and optical characterization, supporting researchers in developing high-performance microscopy workflows for complex materials systems.