Efficient TEM and APT Sample Preparation for Reliable Insights

TEM and APT sample preparation defines the quality of nanoscale characterization. With automated FIB-SEM workflows, researchers achieve reproducible, damage-free lamellae that accelerate discovery and strengthen confidence in results.

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Enabling Overnight, High-Yield TEM Preparation in Materials Science Labs

Routine TEM sample preparation often limits productivity. With TESCAN’s automated plasma FIB-SEM workflows, high-throughput preparation can run overnight, maximizing microscope utilization.

Enable unattended, automated TEM lamella production
Increase yield of high-quality samples per day
Free up researchers’ time for analysis instead of preparation

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TEM image of ZrO2 acquired with TENSOR microscope from TEM sample prepared automaticaly and particular phase map

High-Quality TEM Samples with Plasma FIB-SEM

Ion implantation and damage layers compromise TEM analysis. TESCAN plasma FIB-SEM technology delivers clean lamellae with reduced damage, even on sensitive materials.

Minimize Ga+ implantation by using Xe plasma FIB milling
Produce damage-free surfaces for accurate structural analysis
Maintain integrity of delicate or beam-sensitive materials

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Automated TEM Final Polishing for Reproducibility

Manual final thinning is a major source of variability in TEM workflows. Automated routines in TESCAN systems ensure consistent, repeatable lamella polishing for robust results.

Standardize final polishing to reduce operator bias
Improve reproducibility across multiple samples and users
Support statistically reliable research outcomes

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Array of TEM samples prepared from several materials with minimal adjustments to the automated template-1 (1)

TEM Preparation from Challenging Materials and Geometries

Not all samples are easy to thin — composites, multi-layered structures, or unusual geometries present difficulties. TESCAN FIB-SEM solutions provide flexible strategies to address these challenges.

Adapt workflows to complex or non-standard geometries
Handle hard–soft or multi-phase material combinations
Expand applicability of TEM preparation to diverse research fields

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Stacking faults at the interface revealed using the HADF STEM detector in FIB-SEM-1 (4)

Streamlined TEM Preparation in Materials Science Labs

Efficient workflows are essential in labs with high sample demand. TESCAN automation and intuitive software streamline preparation steps, reducing turnaround time.