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Failure Analysis in Lithium-Ion Batteries

Battery safety and lifespan depend on understanding how cells degrade under cycling, heat, and complex operating conditions. Failure mechanisms such as particle degradation, electrolyte dynamics, and internal delamination can reduce capacity and trigger safety risks.

Delayering_and_Electrical_Failure_Analysis_SUB-AREA
Delayering_and_Electrical_Failure_Analysis_SUB-AREA

Tescan solutions for Batteries:

Failure Analysis and Characterization in Lithium-ion Batteries
Heating of Lithium-ion Battery and Visualization of Electrolyte Dynamics

Thermal effects play a key role in failure mechanisms. Using Tescan’s in-situ workflows, electrolyte dynamics can be visualized under heating to reveal degradation pathways.

  • Observe gas formation and electrolyte distribution during heating
  • Track microstructural and chemical changes in real time
  • Support safety testing and predictive modeling of thermal effects
Electrode Particle Degradation Characterization

Electrode particle degradation drives capacity fade and internal resistance growth. Tescan AMBER X 2 with ToF-SIMS and Raman spectroscopy enables full structural and chemical analysis of degradation processes.

  • Visualize exfoliation and fracturing in anodes and cathodes
  • Map lithium trapping and chemical inhomogeneity in 3D
  • Correlate microstructural and chemical data for targeted improvements
Spectral CT in the World of Electronics: Moving Toward Failure-free Devices

As electronics become smaller and more integrated, ensuring internal quality without disassembly is increasingly essential. Tescan’s spectral micro-CT reveals internal defects and material inconsistencies in wearables and PCBs, non-destructively, in full 3D.

  • Separate copper, solder, and polymers in dense PCB assemblies
  • Detect battery delamination inside smart rings without opening the device
  • Identify high-Z elements like tungsten and gold via K-edge spectral imaging

Tescan Solutions

For Battery Failure Analysis

Tescan AMBER X 2 Plasma FIB-SEM 

High-throughput FIB-SEM for large-volume electrode analysis and failure control.

  • Acquire 3D datasets of electrode porosity, microstructure, and composition
  • Perform automated, statistically meaningful tomography
  • Support process optimization with reproducible results 

 

Tescan UniTOM XL 

Large-scale micro-CT for assembled battery inspection and geometry control.

  • Scan full cylindrical cells without disassembly
  • Quantify anode overhang and internal alignment
  • Detect defects and asymmetries impacting safety and lifespan 

Explore the system that moves your research forward 

Tescan instruments are designed to help you get answers. Fast and precisely. Talk to our experts and see the solution in action. 

GET IN Touch

Contact us

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Where can you find us:

Tescan
Libušina třída 21
623 00 Brno
Czech Republic

info@Tescan.com