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Tescan EXLO in Action: Fast, Reliable and Scalable TEM Specimen Preparation

webinar

Remove bottlenecks in TEM workflows by taking lift-out outside the FIB-SEM and into a dedicated EXLO station

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Webinar description

Modern materials research demands both high-throughput characterization and damage-minimized TEM sample preparation with high reproducibility. The Tescan AMBER X 2 with Mistral™ plasma FIB technology addresses both requirements in one system.

This webinar demonstrates how plasma FIB-SEM now delivers artifact-free TEM lamellae preparation alongside large-scale volume analysis. You'll see real applications and workflows that showcase this dual capability.

What will you learn

How EXLO decouples lamella manipulation from milling to keep FIB-SEM instruments focused on high-value work
How a single EXLO platform can support multiple FIB-SEMs to increase throughput and reduce cost per specimen
How EXpressLO slotted grids and AspiratoTM vacuum-assisted transfer tools ensure secure placement and reproducible TEM results

Meet the speakers

Dr. Lucille A. Giannuzzi, FAVS, FMSA, FMAS

Dr. Giannuzzi is an internationally recognized expert in focused ion beam (FIB) technology and electron microscopy, with decades of experience advancing transmission electron microscopy (TEM) specimen preparation workflows in both academia and industry. She is the inventor of the EXpressLO (EXLO) technology, which has transformed ex situ lift-out techniques and accelerated specimen preparation.

She serves as an Adjunct Professor at SUNY Stony Brook and is a Fellow of the American Vacuum Society (AVS), the Microscopy Society of America (MSA), and the Microanalysis Society (MAS). With over 100 peer-reviewed publications and pioneering contributions to S/TEM specimen preparation, Dr. Giannuzzi continues to shape the field through her innovations, teaching, and leadership in the scientific community.

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EXLO in Action: Fast, Reliable and Scalable TEM Specimen Preparation

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