Brno, Czech Republic, July 23, 2026: Tescan today announced the launch of the new Tescan CLARA™, a next-generation ultra-high-resolution scanning electron microscope for nanoscale materials characterization. The system is designed to help researchers examine demanding samples at low landing energies, distinguish complementary contrast signals, and move efficiently from sample overview to regions of analytical interest. Its capabilities include low-keV ultra-high-resolution SEM imaging, multi-contrast detection, flexibility for challenging materials, and faster navigation from setup to results.
This new generation of CLARA™ advances resolution performance, detector response, and workflow control for research laboratories, core facilities, and industrial R&D teams. It supports characterization of non-conductive, magnetic, beam-sensitive, porous, and highly topographic samples, helping users acquire surface-sensitive and material-contrast information while adapting imaging conditions to the specimen under investigation.
“In materials research, important information is often found in subtle surface structures, thin layers, local composition changes, or features that are difficult to image without changing the sample,” said Sirine Assaf, CRO at Tescan. “CLARA™ is designed to support this work by combining low-energy imaging, complementary detection, and practical workflow control in one platform.”
CLARA™ is engineered to deliver ultra-high-resolution imaging at low landing energies, a critical capability for modern nanoscale materials characterization. Low-keV imaging helps researchers observe fine surface structures, nanoparticles, thin layers, and delicate features while reducing beam interaction volume and helping preserve sample integrity.
For non-conductive or beam-sensitive materials, CLARA™ supports stable low-energy imaging that can reduce the need for conductive coating and minimize preparation-related artifacts. Its field-free optics enable reliable imaging of magnetic materials without the limitations associated with immersion-lens systems.
By combining high-resolution performance with flexible sample handling, CLARA™ enables researchers to study materials closer to their natural state and with greater confidence in the integrity of the observed structures.
CLARA™ uses a detection concept designed to extract complementary information from the same region of interest. The system combines in-column detection with advanced backscattered electron signal selection, enabling users to access contrast information from surface and near-surface regions.
The MultiDetector™ enables energy-filtered BSE imaging, supporting surface-sensitive material contrast and helping reveal features such as contamination, thin surface layers, particles, and subtle material variations that may remain hidden in standard imaging. The Axial detector supports high-resolution surface-sensitive imaging and provides material contrast in BSE mode.
Together with additional BSE detection options, CLARA™ enables users to compare material contrast from different signal perspectives, including surface detail, topographic response, material contrast, and near-surface information.
Materials research rarely follows a single path. CLARA™ supports diverse applications, including advanced materials and nanotechnology, industrial failure analysis, microelectronics, energy materials, metals, ceramics, polymers, and surface modification studies.
The system supports high-resolution characterization of non-conductive and magnetic samples, while MultiVac™ low-vacuum capability enables work with charging, porous, outgassing, or beam-sensitive materials. Fast switching between high- and low-vacuum modes helps maintain continuity in analytical workflows.
For laboratories that need to connect imaging with deeper analysis, CLARA™ offers a versatile platform for integrated techniques including EDS, EBSD, Raman, CL, WDS, ToF-SIMS, and 4D STEM. This flexibility allows research teams to combine structural, surface, compositional, crystallographic, and chemical information within a single microscopy environment.
CLARA™ is designed to make advanced nanoscale characterization more efficient. Tescan Essence™ software, Wide Field Optics®, and automated workflow tools help users move from sample overview to high-resolution imaging while maintaining orientation and context.
Features such as Continual Wide Field, automated focus and stigmation, real-time movement awareness through the Essence™ 3D Collision Model, and guided operation reduce the time and effort required to locate regions of interest, optimize imaging conditions, and acquire reliable data.
These workflow improvements are especially valuable in shared laboratories and core facilities, where users may have different levels of SEM experience. CLARA™ helps experienced operators work faster while supporting newer users with automation, safety features, and intuitive controls.
With the new generation of CLARA™, Tescan provides an SEM platform that brings together resolution, contrast, analytical flexibility, and usability for routine and advanced nanoscale characterization.
Tescan develops and manufactures advanced electron microscopy solutions for materials science, life sciences, semiconductor research, industrial R&D, and quality control. With a focus on imaging performance, automation, usability, and long-term collaboration, Tescan helps researchers see the invisible and accelerate discovery through reliable, future-ready microscopy workflows.
For further information, interview requests, or media inquiries, please contact:
Jana Šilarová, Marketing Director
Marketing Department
Tescan Group, Libušina třída 21; 623 00 Brno – Czech Republic
Phone: +420 778 788 844
Email: jana.silarova@tescan.com