Mohammad Taghi Mohammadi Anaei, a Tescan Ph.D. Fellow and Ph.D. candidate at the University of Connecticut, received the Best Student Presentation Award at the IMAPS 2026 Symposium in Boston, Massachusetts.
His research focused on metrology-driven sample preparation for advanced microelectronics, highlighting the use of Tescan FemtoChisel™, intelligent multigas processing, laser protective layer (LPL) technology, and AI-enabled correlative workflows.
Taghi's presentation, “Metrology-driven sample preparation for advanced microelectronics using Tescan FemtoChisel™ with intelligent multigas processing, LPL, and AI-enabled correlative workflows,” explored approaches to addressing the increasingly complex sample preparation and metrology requirements of advanced microelectronics.
His research demonstrated the potential of integrating femtosecond laser processing with intelligent multigas processing and AI-enabled correlative workflows to support precise, site-specific sample preparation and characterization. These capabilities are particularly relevant to advanced semiconductor packaging, where complex device architectures require accurate access to features of interest for metrology and failure analysis.
The IMAPS 2026 Symposium brought together researchers and industry experts to share technical advances, address emerging challenges, and explore new technologies in microelectronics manufacturing, semiconductor packaging, and heterogeneous integration.
The recognition reflects the technical relevance of Taghi's work within the international microelectronics community and highlights the potential applications of Tescan FemtoChisel™ in advanced packaging, precision sample preparation, and semiconductor failure analysis.
Tescan congratulates Taghi on this achievement and acknowledges the guidance of Dr. Tavousi and Dr. Shahbazmohamadi in supporting his research.