The new TESCAN ORAGE 2 FIB is the next generation of TESCAN’s Ga⁺ FIB technology, delivering outstanding precision and significantly faster TEM lamella preparation without compromise in quality — now fully integrated into the SOLARIS 2 FIB-SEM platform.
Register for our webinar and learn how the new TESCAN ORAGE 2 FIB combines advanced automation and optimized Ga⁺ ion optics to overcome the challenges of preparing high-quality TEM lamellae from complex semiconductor structures such as 3D NAND and FinFET devices.
Time and Date
December 12, AM and PM Session
Ideal for
What will you learn?
Time and Date
December 12, AM and PM Session
About Webinar Host
Lukas Hladik
Lukas is a Product Marketing Manager for FIB-SEM, characterization, and delayering/probing solutions for FA semiconductor R&D labs. He joined Tescan in 2012 as an application specialist for Plasma FIB-SEM platforms. All his work Tescan has been connected extensively with the worldwide semiconductor industry. Lukas has a Master’s degree in Physical Engineering and Nanotechnology from Brno University of Technology, Brno, Czech Republic.
ORAGE 2 combines speed, precision, and automation to make advanced TEM lamella preparation faster, more accessible, and consistently reliable — helping every lab achieve more with less effort and downtime.