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National CEMS Conference 2025: Tescan Highlights Innovation in Electron Microscopy

Written by TCN admin | Nov 27, 2025 7:30:00 AM

 

The 2025 National Conference on Electron Microscopy of China (National CEMS 2025), held from September 27–29, brought together more than 2,000 experts and scholars to discuss the latest advances in electron microscopy. Across 15 specialized sub-forums, participants explored topics ranging from foundational imaging principles to emerging interdisciplinary applications.

Tescan’s Evolving Identity and Commitment to Innovation

 

At the event, Tescan presented its renewed visual identity alongside new technologies that demonstrate its dedication to innovation and precision. This evolution reinforces Tescan’s focus on delivering comprehensive workflow solutions that enable researchers to move efficiently from data collection to insight, with an emphasis on reliability, usability, and meaningful scientific outcomes.  

 

Showcasing Tescan AMBER X 2 and TENSOR

 

Tescan presented two major technology highlights: 



 

Advancing Research Through Collaboration

 

These innovations reflect Tescan’s broader commitment to supporting researchers through comprehensive solutions that integrate automation, data management, training, and long-term collaboration. 

 

 

The National CEMS Conference 2025 offered a platform for Tescan to showcase its commitment to advancing the field of electron microscopy through innovative technologies and comprehensive solutions. Tescan's participation at the conference emphasized its role in supporting researchers and promoting scientific discovery.